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  2. Universitat Rovira i Virgili
  3. Departament d'Enginyeria Electrònica, Elèctrica i Automàtica
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Universitat Rovira i Virgili

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Characterization and Compact Modeling of Flicker Noise and Piezoelectric Effect in Advanced Field Effect Transistors 

Muhea, Wondwosen Eshetu (Date of defense: 2019-07-08)

El'objectiu d'aquesta tesi és el modelatge compacte basat en la física dels transistors de pel·lícula prima i d'alta mobilitat d'electrons (TFTs, HEMTs). En primer lloc, s'ha realitzat la caracterització ...

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Iñiguez Nicolau, Benjamin (1)

Date of defense

2019 (1)

Language

English (1)

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Keywords and Knowledge Area

Compact Modeling (1)

Enginyeria i arquitectura (1)

Flicker Noise (1)

Modelatge compacte (1)

Modelo Compacto (1)

... Show more

Subjects

004 (1)

53 - Physics (1)

62 - Engineering. Technology in general (1)

621.3 Electrical engineering (1)

... Show more

Full text availability

Open access (1)

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