Yedra Cardona, Lluís (Date of defense: 2013-12-18)
The main goal of this thesis is to combine electron tomography and electron energy loss spectroscopy (EELS) in the TEM, in order to obtain chemical and electronic information in 3D in the nanoscale. ...
Arbiol i Cobos, Jordi (Date of defense: 2001-07-19)
Recently, there has been an increasing interest in the electronics world for those aspects related to semiconducting gas sensor (SGS) materials. In view of the increasingly strict legal limits for ...
Rossinyol Casals, Emma (Date of defense: 2008-01-31)
Aquest treball es va iniciar amb la intenció de millorar les propietats sensores d'alguns òxids metàl·lics tan a partir del control del creixement dels cristalls en el cas de capes fines, com en l'augment ...
López Conesa, Lluís (Date of defense: 2015-12-18)
Being able to directly relate the final properties with the intimate structure provides a unique insight into the functionality of materials and devices, especially when compared to the necessarily ...
Eljarrat Ascunce, Alberto (Date of defense: 2015-10-21)
This thesis explores the analytical capabilities of low-loss electron energy loss spectroscopy (EELS), applied to disentangle the intimate configuration of advanced semiconductor heterostructures. Modern ...
Torruella Besa, Pau (Date of defense: 2019-04-26)
[eng] The aim of this thesis has been two-fold. First, to develop new processing and analysis tools and strategies for extracting information from EELS data, and second, to apply the methods to different ...
Blanco Portals, Javier (Date of defense: 2021-03-04)
This thesis has been primarily dedicated to the exploration and implementation of new computational analysis tools and techniques for the characterisation of nanomaterials and devices via transmission ...
Berestok, Taisiia (Date of defense: 2018-07-13)
This thesis focuses on different aspects of NCs colloidal synthesis, the exploration of the relevant surface chemistries that afford NC assembly and the NC implementation into porous nanomaterials. The ...
Estradé Albiol, Sònia (Date of defense: 2009-02-21)
In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic ...