Toggle navigation
Home
About TDX
Contact Us
Language
English
català
Spanish
Log In
Home
About TDX
FAQ
Contact Us
Language
English
català
Spanish
Log In
Home
Universitat Rovira i Virgili
Departament d'Enginyeria Electrònica, Elèctrica i Automàtica
Filter by: Keywords and Knowledge Area
JavaScript is disabled for your browser. Some features of this site may not work without it.
Universitat Rovira i Virgili
Filter by: Keywords and Knowledge Area
Results per page
5
10
20
40
60
80
100
update
Displaying items 1-1
5
10
20
40
60
80
100
Compact modeling of gate tunneling leakage current in advanced nanoscale soi mosfets (1)
